Additive Manufacturing Security: Design, Materials and Sensor based Solutions. A panel discussion organized by New York University Center for Cybersecurity with the support from the National Science Foundation. The panelists include Dr. Eric MacDonald of UT-El Paso, Dr. Dirk Lehmhus of IFAM, Germany, and Dr. Jian Yu of Army Research Laboratory. The panel was moderated by Dr. Justin Scott of TMS.
Dr. Nikhil Gupta and Anton Paar USA announce multi-year instrument collaboration
Anton Paar USA is proud to announce a multi-year collaboration with award-winning professor, Dr. Nikhil Gupta from New York University (NYU). For at least three years, Dr. Gupta and his research team at NYU will use Anton Paar’s high-end dynamic mechanical analysis (DMA) device, the MCR 702 MultiDrive™ as part of a loan agreement. …Click here for the full story…
Presentation”Peak Your Frequency: Advanced Search of 3D Computer Aided Design Files in the Fourier Domain”
The first author Dimitris Mouris from University of Delaware presents the paper published in IEEE Access and a demo of the software that searchers CAD files based on the object shape in a database of design files: https://ieeexplore.ieee.org/abstract/… Peak your Frequency: Advanced Search of 3D CAD Files in the Fourier Dimitris Mouris, Charles Gouert, Nikhil Gupta, Nektarios Georgios Tsoutsos 2020/7/31 IEEE Access 141481-141496 Acknowledgment: National Science Foundation Collaborators: University of Delaware and New York University